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glizzyguzzler ,
@glizzyguzzler@lemmy.blahaj.zone avatar

The metal moves due to very different reasons. I would not say whiskers due to mechanical/residual stresses are due to “electromigration” - electromigration isn’t even there since the wiki definition is “transport of material caused by the gradual movement of the ions in a conductor due to the momentum transfer between conducting electrons and diffusing metal atoms”. You build stresses and strains into semiconductors for better mobility profiles, and I’m sure that can cause whiskers - but again, it’s not electromigration.

Electromigration, as noted, plays a role in the form of encouraging stress whiskers to grow in a direction (with a very relaxed definition).

But in ICs, with their very unique extremely small scales, electromigration can directly form whiskers by moving individual ions via electron collisions. But the generation mechanism for those whiskers shares nothing with Big Whiskers generation mechanism. That’s my point.

Electrons in metal do not always move at the same speed; they move at v=mu*E where v is the velocity, mu is the electron mobility, and E is the electric field. Crank the E, you go faster. At very high E fields you reach the electron saturation velocity where slowing factors limit the maximum speed - I assume in your IC world you’re basically always there due to the extremely small regions (E = V/m; any V with m at nanometers is big E) which is why you claim that. But even then the electrons are accelerating due to the E field, smashing into ions and losing their momentum (mass static, so it’s just velocity), and then re-accelerating. The saturation velocity is the average bulk motion of electrons but it’s not a smooth highway, it’s LA traffic (constant crashes).

Electrons can gain significant momentum, which is just their static mass times their velocity. Limited at velocity by the saturation velocity, current density is important for significant momentum exchange. Luckily ICs are so tiny that the currents they drive are massive current densities.

What you said originally is correct; it’s just in ICs electromigration can cause whiskers. In the Big World it can’t. But it can influence Big Whiskers to grow to the worst places and fuck up things optimally if you take an extremely relaxed view of electromigration that defines it as “movement of ions encouraged by an electric field”.

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