#Journals | #EPJ Applied Physics
"The reliability impact of N doping on the HfO2 charge-trapping layer: a first-principles study"
Fengyu Ye from #WuhanUniversity
Explore the cutting-edge research in material science and semiconductor technology!
➡️ https://bit.ly/3WWSf0v
Reading Chip War and it’s interesting how American companies did the same thing with semiconductors and Japan that they later did with China and everything else - just the racist assumption that nobody in those countries would ever figure out how to duplicate and then improve upon their technology.
Japan doesn’t seem to have been as openly theft-oriented as China, but they weren’t above corporate espionage shenaniganry.